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Preparation of Semiconductor (Bulk Growth), Czochralski, Float Zone…
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Czochralski
Process
- Preparation of High-Purity of Molten Si
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- Pulling the seed upwards while rotating
Components
Furnace : fused silicon crucible (SiO2), a graphite susceptor, a rotation mechanism (clockwise), heating element and power supply.
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Control system: Control the process parameters such as temperatures, crystal diameter, pull rate & rotation speed.
Limitations
- More than 99% of Si02 is lost as SiO gas from the molten surface
- The silicon monoxide evaporating interacts with the hot graphite susceptor and forms carbon monoxide that re-enters the melt.
- The impurity concentration incorporated into the crystal (solid) is different from the impurity concentration of the melt (liquid) at the interface.
- Lower the minority carrier diffusion length in the finished silicon wafer.
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