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CHARACTERIZATION OF NANOMATERIALS, APPLICATION: FIM is the micro…

- - - - IMAGE MODE:To analyse microstructure(eg:Grain size and lattice defects
        
        DARK FIELD IMAGE AND BRIGHT FIELD IMAGE
      - DIFFRACTION MODE:Used to tell about the material's single crystal or polycrystalline material and to examine crystalline structure
        
        $TEM-image-and-electron-diffraction-pattern-of-the-purified-gold-nanoparticles-a-TEM$
      - KIKUCHI PATTERN: Gives more accurate orientation determination
    - - Particle Morphology at sub nm resolution
- - - - COMPUTER:Allows user to interact with AFM
        
        FEEDBACK:To maintain constant tip sanple interaction
        
        VOLTAGE RAMPS:To generate the X and Y motion of the tip
        
        PHOTODETECTOR:Monitor the cantilever deflection
        
        DIODE LASER:Laser beam is reflected off the cantilever
        
        PIEZO-SCANNER:Moves the probe relative to sample
  - - - RESOLUTION:10-20nm lateral
        :and 0.01 (<1nm) vertical resolution on all types of samples
        
        No vacuum is required,both dry &liquid condition can be tested
- - - - 3)ROTATING CRYSTAL METHOD:find unknown crystals
- - - - Resolving power R= λ /
        2NA
        λ is the wavelength of electrons used
        NA is the numerical aperture