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Scanning electron, Continuous improvement (CI), X -Ray diffraction, NDT…
Scanning electron
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resolution
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problems in resolving
Lens aberrations
Spherical abberation
Focal point mismatch
at the end o the lens, the bending is more
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Detectors
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Forward scatter
when direct viewing doesn't help, detector at an angle to give a different perspective
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X -Ray diffraction
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by analyzing the constructive interference from the diffracted crystal structure, the type of crystal structure can be identified.
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Rayleigh resolution
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if the max intensity of one body lies on min of the next body then their is a dip of 80% in between??
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AES
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Process
- Atomic bombardment/ionization
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Fractography
mode of fracture
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Fatigue
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Ratchet marks
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even without beach marks, these particular marks can indicate
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Hackle or chevron marks point to the origin of the fatigue/ also in case of other sort of fracture initiations like impact etc.
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Tof SIMS
Higher the particle size , higher the atoms shot out
Bombardment of ions like Cs+, O2+, Ar+ and Ga+
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Basic principle
XPS
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Strength:
GOOD quantification
EXCELLENT chemical state determination (biological to metals)
gives an idea about valence interactions
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Application:
Check the chemical state of elements
Stability of passive films on stainless steel
Oxide composition
Oxide thickness
Distribution of ions
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AES
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Principle: Beam falls, electron are excited and relaxation of the atom throws out an electron. Auger electrons are also ejected.
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Process
SEM
Secondary Electrons
Topography
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can give an idea of surface roughness, more roughness = less secondary electron emission received
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acceleration voltage dependent, has a peak
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