Solving problems principles
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Metrology Support
Main problems to solve
Autofunctions
Autofocus
Surface Reconstruction
Anomalies Detection
Objects Detection & Verification for autoviewport
Team knowledge base
Background
Research & experiments
Update a list of topics of interest and mark them as mandatory, required or desirable. Mandatory topic: Everyone in the team should be familiar with it. There must be provided a list of literature that covers that topic in minimal content. Required topics are those that are a must for the team, but not a must for each in the team. Every required topic should be covered by at least by two team members. The more we distribute the required topics the larger and deeper is our team knowledge base. Desired topics are those that are not widely used in MaxInspect but may be applied in future.
Specific algorithms we use
Try to perform bias-variance error decompostion when possible
Singling out sources of inaccuracy in metrological tests; for every source of inaccuracy there should be a test that is able to precisely identify if that source is critical. The tests that are now used by metrology to identify if device is "good" or "bad" but don't explain what exatly is "bad" should be reviewed and replaced with more descriptive tests (like left-to-right reproducibility tests on ferrule)
Modelling
Documentation: All the specific algorithms that we develop should be structured and documented. We may create a requirement that the corresponding bugzilla bug must not be closed until the algorithm is not described in Wiki.
Systematization first: most critical problems should be investigated first and there is no need to go much deeper (if it's time consuming) than the problems we have.
Improve research documentation and sharing culture
All modeling scripts should be publicly available, easy-to-parametrize and easy-to-use.
Implement automatic tests on modeled data to be able to test the algorithms on a wide set of inputs and check their limits.
Systematization
All algorithmic problems and their possible reasons should be listed and their criticalness estimated. It will help to find the gaps in our knowledge base and algorithms and plan corresponding research.
Scratch detection
Defect detection
On interferometers
On microscopes
Lignt defects detection
3D defect detection
One of the simplest models is pertubated real data, it can be used for experiments
Fiber Detection
Other
Scratch 2D and 3D parameters calculation
False positive scratches
MT
Special connectors
Fibers detection
Fiber verification
Observed problems
Fiber heights device bias
Underlying inaccuracies
Core dip repeatability
Ghost steps
Surface splicing
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Piezo/motor steps determination
Bugs that systematically appear
Setting correct exposure for scratch detection
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Cracks on the border are not detected