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Basic Test Methodology RCG ppt. (Basic Test flow (VCC Cont, Functional,…
Basic Test Methodology RCG ppt.
Purpose of Testing
meet AC/DC specifications
bin devices based on speed
Screen out Defects
improve manufacturing process
Criteria for Good TP
short test time
consistent results
Low Overkill
easy to maintain
High test coverage
Basic Test flow
VCC Cont
Functional
opens
EDC_ILDV/Icc
Short
Leakage
Vin/Vout
AC test
Common Terms
ISO - Distribution Defect on Wafer
RC - Raw Class : Test socket before Burn In
PBIC - Post Burn In Check : Test socket after burn in
EQA - Elimination of QA
Qual - Qualification of product/process
Funtional Test
Purpose :
validate device design
catch functional failures
Tester drive inputs and compare outputs response from "DUT" using patterns
Functional Tests
Basic fucntional - done at nominal freq. & test the DUT logic
Full Functional - done at Spec freq. testing logic and delay defect
AC functional - done at spec freq. testing for I/O timing
LOW freq functional - test for node leakage defects
Data
Vector - set of 1's & 0's applied at input and compared at output
Patterns - set of vectors
Levels - voltage levels to consider logic 1's or 0's
Timings - tells tester when to drive & compare
Input timing - when to turn on/off driver
output timing - when the output DUT should be compared
Parametric Test
Purpose :
A.K.A DC test
ensure devices that do not meet spec's are screened out
Shorts/Opens
Purpose :
screen tester / handler setup issue
-silicon defect which cause prob between tester & DUT
VCC Cont.
Purpose :
-screen defects which cause shorts between VCC & VSS both for Die & Package
-Check device orientation
Leakage test
Purpose :
test for leakage current path flowing in the circuit
detect EOS (electrical overstress)
detect ESD ( electrostatic discharge)
Guardbanding :
compensate for tester inaccuracy
Tester Guardband :
a correction which accounts for tester inaccuracies
for repeatability (short term variability)
Correlation Guardband :
2 X tester guardband
QA limit is one tester guardband looser than spec
class is one tester guardband tighter than spec
reproducibility for long term (tester to tester)